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Start a SimulationReference design of CRD-30DD12N-K: open loop test function
Hello,
With respect to the reference design of CRD-30DD12N-K, I have a question on the firmware feature.
It seems that the firmware provides the open loop test function for this LLC topology.
What should be measured or examined during the open loop test function?
Thank you for your consideration.
With regards,
GKIM
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