Wolfspeed Power Applications Forum

Wolfspeed Technical Community:

SpeedFit™ Design Simulator

Simulate and evaluate the performance of SiC-based power circuits and determine the right SiC device in seconds.

Start a Simulation

Categories

large oscillation in double pulse test

Options
araina
araina Contributor Level 1
in Module Products

Hello, currently we are using the mother board MOD-MB-HB-0900V-40A together with the power daughter card MOD-PWR-MM-C3M0040120K and the gate driver CGD12HBXMP for double pulse testing with SiC devices. So far no components on the boards have been modified. At the moment, we are seeing very large (impractical) oscillations in the Vgs, Vds and Id waveforms of both upper and lower devices. In the picture below CH1 is the Vgs of upper device, CH2 is the Vgs of lower device and CH3 is the Vds of lower device. We already know this oscillation is not caused by the paracitics of the MOSFET itself, because we have tested he same MOSFET before and the noise is much smaller. Is this problem related to the compponents e.g. gate resistance on board? Or is it a genearl issue of this board that it will result large noise at high frequency? Thank you for your help in advance.

oscillation.png

Comments

  • Forum_Moderator
    Forum_Moderator Wolfspeed Employee - Contributor Level 5
    Options

    Thank you for your post, it has been approved and we will respond as soon as possible.

  • TBhatia
    TBhatia Wolfspeed Admin - Contributor Level 5
    edited February 13
    Options

    Hello araina,

    Thank you for your question. Can you please confirm which probes are used on each channel? You mentioned you're running a DPT but seems like your high-side device is also switching? Can you please confirm what test are you running?

    If possible it will be great if you can also send the picture of the set-up. Thank you!

Sign In or Register to comment.